Mader, W., & Ernst, F.(1998).Papers Dedicated To Professor Dr. Manfred Rühle on the Occasion of His 60th Birthday– Preface. Physica Status Solidi A, 166(1), 5-6.
French, R. H., & Thiele, E.(1997).Computational Modeling of {TiO2} Particle Optics Using a Finite Element Method. Proceedings of the Paint Research Association,().
French, R. H., & Müllejans, H.(1997).Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure. Proceedings of the Microscopy Society of America,().
Baither, D., Messerschmidt, U., Baufeld, B., Bartsch, M., & Ernst, F.(1997).In-situ Straining Experiments in HVEM to Study Deformation of Zirconia and NiAl. ,(), 517-530.
Lyutovich, K., Ernst, F., Banhart, F., Silier, I., Gutjahr, A., & Konuma, M.(1997).Defect Distribution in Compositionally-Graded EpitaxialSiGeLayers on Si Substrates. Inst. Phys. Conf. Ser., 157(), 131–134.
Kienzle, O., & Ernst, F.(1997).Effect of Shear Stress on the Atomistic Structure of a Grain Boundary in Strontium Titanate. Journal of the American Ceramic Society, 80(), 1639–1644.
Ernst, F.(1997).Interface Dislocations Forming in GeSi Layers During Epitaxy on {111} Si Substrates at High Temperatures. Materials Science and Engineering A, 233(), 126–138.
Schweinfest, R., Gemming, T., Kopold, P., Ernst, F., & Rühle, M.(1997).Measurement of Tridentate Astigmatism of a Conventional HRTEM and a high-vacuum HRTEM. European Journal of Cell Biology, 74(), 78-78.
Klement, U., Horst, D., & Ernst, F.(1997).Microstructure of Thin Film Photoconductors and its Correlation with Optical and Electronic Properties. , 452(), 925–930.
Kienzle, O., Exner, M., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy. , 466(), 95-106.
Ernst, F., & Rühle, M.(1997).Present Developments in High-Resolution Transmission Electron Microscopy. Current Opinion in Solid State & Material Science, 2(), 469-476.
Recnik, A., Langjahr, P., & Ernst, F.(1997).Structural Characterization of SrZrO3/SrTiO3 Epitaxial Layers by HRTEM. Journal of Computer-Assisted Microscopy, 9(), 35–36.
Nadarzinski, K., Kienzle, O., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy. San Francisco Press Inc.,().