Ernst, F., Hofmann, D., Nadarzinski, K., Stemmer, S., & Streiffer, S.(1996).Quantitative High-Resolution Electron Microscopy of Interfaces. Transtec Publications Ltd.,(), 23–34.
Ernst, F., Finnis, M., Gust, W., Koch, A., Schmidt, C., & Straumal, B.(1996).Structure and Energy of Twin Boundaries in Copper. Zeitschrift für Metallkunde, 87(), 911–922.
Ernst, F., & Rühle, M.(1996).Structure of Twin Boundaries in Copper, Studied by Quantitative High-Resolution Transmission Electron Microscopy. The Japan Institute of Metals,(), 3–10.
Nadarzinski, K., & Ernst, F.(1996).The Atomistic Structure of a =3, (111) Grain Boundary in NiAl, Studied by Quantitative High-Resolution Transmission Electron Microscopy. Philosophical Magazine A, 74(), 641–664.
French, R. H.(1995).Interfacial Electronic Structure and Full Spectral Hamaker Constants of {Si3N4} Intergranular Films from {VUV} and {SR-VEEL} Spectroscopy. Materials Research Society,().