Thursday, January 1, 2015
Yang, R., Tupta, M., Marcoux, C., Andreucci, P., Duraffourg, L., & Feng, Philip X. -L.
(2015).
Capacitance-Voltage (C-V) Characterization in Very Thin Suspended Silicon Nanowires for NEMS-CMOS Integration in 160nm Silicon-on-Insulator (SOI).
IEEE,
(),
1175-1178.